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xi | |
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xiii | |
Foreword |
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xvii | |
Preface |
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xix | |
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What is Quality Engineering? |
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1 | (2) |
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Quality Engineering and Experimental Design |
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3 | (2) |
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Interactions and Orthogonal Arrays |
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5 | (4) |
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Robust Technology Development |
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9 | (4) |
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What is a Signal-to-Noise Ratio? |
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13 | (1) |
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Where Can SN Ratios Be Used? |
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14 | (3) |
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17 | (2) |
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Benefits of Using SN Ratios |
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19 | (4) |
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Inverse Proportionality to the Loss Function |
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20 | (1) |
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Simplification of Direct Product Design |
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20 | (1) |
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Simplifies Attainment of Robust Design |
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20 | (1) |
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Simplification of Adjustments or Calibrations |
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21 | (1) |
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Efficient Evaluations for Measuring Systems |
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21 | (1) |
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Reduction of Product-Development Cycle Time |
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22 | (1) |
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Research Applies to a Group of Products (Robust Technology Development) |
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22 | (1) |
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23 | (5) |
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An Example of a Measurement System |
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23 | (2) |
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An Example of an Extrusion Process |
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25 | (3) |
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28 | (5) |
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Layout of Orthogonal Arrays for Parameter Design |
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33 | (6) |
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39 | (1) |
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Classification Based on the Type of Data |
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39 | (2) |
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Attribute-Type Data is not Fully Informative |
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40 | (1) |
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Attribute-Type Data is Inefficient |
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40 | (1) |
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Using Attribute-Type Data may Lead to Interactions |
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40 | (1) |
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Classification Based on Intention |
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41 | (2) |
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Classification Based on Input and Output |
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43 | (1) |
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Other Ways of Classifying SN Ratios |
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43 | (1) |
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44 | (2) |
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46 | (3) |
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Basic Dynamic-Type SN Ratios for Continuous Variables |
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49 | (1) |
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Zero-Point Proportional Equation |
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49 | (5) |
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Reference-Point Proportional Equation |
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54 | (5) |
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59 | (6) |
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Linear Equation Using a Tabular Display of the Orthogonal Polynomial Equation |
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65 | (4) |
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Numerically Controlled (NC) Machine Processing |
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69 | (28) |
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69 | (2) |
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Experiment and Analysis Using Signal-to-Noise Ratio |
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71 | (5) |
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Interpretation and Prediction |
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76 | (1) |
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77 | (20) |
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97 | (4) |
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Case with an Adjustment Factor |
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101 | (12) |
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Case (I) With Double Signals |
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113 | (5) |
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Case (II) With Double Signals |
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118 | (4) |
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Case When Signal-Factor Levels are Different at Different Runs of an Orthogonal Array |
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122 | (2) |
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124 | (13) |
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What is Split-Type Analysis? |
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124 | (1) |
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Split-Type Analysis for Two-Level Orthogonal Arrays |
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125 | (7) |
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Split-Type Analysis for Mixed-Type Orthogonal Arrays |
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132 | (5) |
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137 | (10) |
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137 | (2) |
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139 | (1) |
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140 | (6) |
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Optimization of Performance |
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146 | (1) |
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Case When True Values of Signal Factor are Unknown |
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147 | (16) |
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Case When Level Interval of Signal Factor is Known |
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147 | (6) |
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Case When Level Ratio is Known |
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153 | (5) |
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Case When Signal-Factor Variance is Used |
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158 | (5) |
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163 | (4) |
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Nominal-is-Best Application |
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167 | (8) |
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Case 1: Non-Negative Data |
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168 | (5) |
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Case 2: Positive and Negative Data |
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173 | (2) |
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Smaller-is-Better Application |
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175 | (1) |
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Larger-is-Better Application |
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176 | (1) |
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Nondynamic Operating Window |
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177 | (10) |
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Difference Between Continuous Variables and Classified Attributes |
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187 | (4) |
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187 | (1) |
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188 | (1) |
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188 | (3) |
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What are the Strategies to Avoid Interactions? |
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191 | (1) |
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Case With Two Classes, One Type of Mistake |
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192 | (4) |
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Case With Two Classes, Two Types of Mistakes |
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196 | (11) |
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196 | (4) |
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Determination of the Standard Rate of Mistakes |
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200 | (1) |
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201 | (5) |
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Comparison of Screening Machines |
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206 | (1) |
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207 | (4) |
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Case With Two Classes Where True Values of Signal Factors are Unknown |
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211 | (3) |
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Case With Three or More Classes Where True Values of Signal Factors are Known |
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214 | (5) |
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Equations for Calculation |
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214 | (2) |
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216 | (3) |
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Case With Three or More Classes Where True Values of Signal Factors are Unknown |
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219 | (4) |
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Case With Three or More Classes Without a Signal Factor (Classes Have an Order) |
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223 | (2) |
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SN Ratio With Complex Numbers |
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The Ideal Function of Electric Circuits |
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225 | (1) |
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SN Ratio for Complex Numbers |
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226 | (4) |
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230 | (6) |
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Development of a Filter Circuit |
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236 | (15) |
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Explanation of the System |
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236 | (1) |
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237 | (1) |
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Target Frequency Characteristic |
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238 | (1) |
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Factors, Levels, and Layout |
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238 | (3) |
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241 | (4) |
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Optimum Condition and Estimation |
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245 | (1) |
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246 | (5) |
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Layout and Analysis of Youden Squares |
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Purpose of Using Youden Squares |
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251 | (2) |
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Calculation of Main Effects |
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253 | (2) |
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255 | (3) |
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258 | (3) |
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261 | (2) |
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Treatment of Incomplete Data |
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263 | (4) |
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267 | (4) |
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267 | (1) |
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267 | (4) |
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Robust Technology Development |
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271 | (1) |
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272 | (1) |
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Development of Hardness Standards |
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272 | (1) |
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Development of a Braking System |
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272 | (1) |
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Development of Ammunition |
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273 | (1) |
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Paradigm Shift Needed: Development of Quality Must Begin in R&D |
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273 | (1) |
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How Robust Technology Development Works: The Main Concepts |
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274 | (7) |
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Two-Step Optimization: Reduce Variability First, Then Place on Target |
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274 | (1) |
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Choice of Right Output to Measure |
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275 | (1) |
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To Get Quality, Don't Measure Quality! |
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276 | (1) |
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Energy Transformation and Definition of Ideal Function |
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277 | (3) |
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280 | (1) |
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Advantages of Using Robust Technology Development |
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281 | (2) |
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281 | (1) |
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282 | (1) |
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283 | (1) |
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How Far Advanced is Robust Technology Development? |
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283 | (2) |
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285 | (1) |
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286 | (16) |
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302 | (9) |
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311 | (6) |
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317 | (10) |
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327 | (4) |
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331 | (4) |
Biographies |
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335 | (1) |
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336 | |