Elements of Information Theory
by Cover, Thomas M.; Thomas, Joy A.Edition: 2nd
Format: Hardcover
Pub. Date: 2006-07-18
Publisher(s): Wiley-Interscience
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Summary
The latest edition of this classic is updated with new problem sets and material The Second Edition of this fundamental textbook maintains the book's tradition of clear, thought-provoking instruction. Readers are provided once again with an instructive mix of mathematics, physics, statistics, and information theory. All the essential topics in information theory are covered in detail, including entropy, data compression, channel capacity, rate distortion, network information theory, and hypothesis testing. The authors provide readers with a solid understanding of the underlying theory and applications. Problem sets and a telegraphic summary at the end of each chapter further assist readers. The historical notes that follow each chapter recap the main points. The Second Edition features: * Chapters reorganized to improve teaching * 200 new problems * New material on source coding, portfolio theory, and feedback capacity * Updated references Now current and enhanced, the Second Edition of Elements of Information Theory remains the ideal textbook for upper-level undergraduate and graduate courses in electrical engineering, statistics, and telecommunications.
Author Biography
THOMAS M. COVER, PHD, is Professor in the departments of electrical engineering and statistics, Stanford University. A recipient of the 1991 IEEE Claude E. Shannon Award, Dr. Cover is a past president of the IEEE Information Theory Society, a Fellow of the IEEE and the Institute of Mathematical Statistics, and a member of the National Academy of Engineering and the American Academy of Arts and Science. He has authored more than 100 technical papers and is coeditor of Open Problems in Communication and Computation.
JOY A. THOMAS, PHD, is the Chief Scientist at Stratify, Inc., a Silicon Valley start-up specializing in organizing unstructured information. After receiving his PhD at Stanford, Dr. Thomas spent more than nine years at the IBM T. J. Watson Research Center in Yorktown Heights, New York. Dr. Thomas is a recipient of the IEEE Charles LeGeyt Fortescue Fellowship.
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